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Addressing design margins through error-tolerant circuits., , , , and . DAC, page 11-12. ACM, (2009)The road to a trillion: Making the IoT work.. VLSI-DAT, page 1. IEEE, (2017)Time to retire our benchmarks.. IEEE Des. Test Comput., 27 (3): 88 (2010)Yield Learning Perspectives.. IEEE Des. Test Comput., 29 (1): 59-62 (2012)Resiliency in dynamically power managed designs., , and . ICCAD, page 69. ACM, (2016)Test as a Key Enabler for Faster Yield Ramp-Up., , , , , , , and . VTS, page 177-180. IEEE Computer Society, (2002)Welcome message., and . ITC, page 1. IEEE Computer Society, (2013)Special Session 4: Reliability and Circuit Simulation.. IOLTS, page 195-196. IEEE Computer Society, (2008)Test implications and challenges in near threshold computing special session., , , and . VTS, page 1. IEEE Computer Society, (2016)Mobile hardware security., and . Hot Chips Symposium, page 1-40. IEEE, (2014)