Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores, , , and . CoRR, (2007)Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 23 (2): 331-341 (2015)Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers., , , and . IEEE Trans. Very Large Scale Integr. Syst., 24 (6): 2286-2298 (2016)Detailed Characterization of Transceiver Parameters Through Loop-Back-Based BiST., and . IEEE Trans. Very Large Scale Integr. Syst., 18 (6): 901-911 (2010)Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring., , and . IEEE Trans. Very Large Scale Integr. Syst., 21 (6): 1116-1128 (2013)Self-Interference Signal Path Characterization in Full-Duplex Transceivers Using Built-in Self-Test., , , and . RWS, page 16-19. IEEE, (2020)Rail Clamp with Dynamic Time-Constant Adjustment., , and . IEEE J. Solid State Circuits, 51 (5): 1313-1324 (2016)Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation., and . J. Electron. Test., 27 (4): 465-476 (2011)Test Signal Development and Analysis for OFDM Systems RF Front-End Parameter Extraction., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (6): 958-967 (2012)Determining Mechanical Stress Testing Parameters for FHE Designs with Low Computational Overhead., , , , and . IEEE Des. Test, 37 (4): 35-41 (2020)