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Traceable Waveform Calibration With a Covariance-Based Uncertainty Analysis.

P. Hale, A. Dienstfrey, J. Wang, D. Williams, A. Lewandowski, D. Keenan, and T. Clement. IEEE Trans. Instrum. Meas., 58 (10): 3554-3568 (2009)

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Simone Williams

Benjamin Williams

Jenny Williams

Lawrence Williams

Sam Dylan Moré

Other publications of authors with the same name

Uncertainty of Timebase Corrections.J. Wang, P. Hale, and D. Williams. IEEE Trans. Instrumentation and Measurement, 58 (10): 3468-3472 (2009)Sequential Estimation of Timebase Corrections for an Arbitrarily Long Waveform.C. Wang, P. Hale, J. Jargon, D. Williams, and K. Remley. IEEE Trans. Instrumentation and Measurement, 61 (10): 2689-2694 (2012)Compensation of Random and Systematic Timing Errors in Sampling Oscilloscopes.P. Hale, C. Wang, D. Williams, K. Remley, and J. Wepman. IEEE Trans. Instrumentation and Measurement, 55 (6): 2146-2154 (2006)Frequency Invariant Beampatterns for Wideband Synthetic Aperture Channel Sounders.P. Vouras, J. Quimby, B. Jamroz, A. Weiss, R. Leonhardt, D. Williams, and K. Remley. SPAWC, page 1-5. IEEE, (2020)Traceable Waveform Calibration With a Covariance-Based Uncertainty Analysis.P. Hale, A. Dienstfrey, J. Wang, D. Williams, A. Lewandowski, D. Keenan, and T. Clement. IEEE Trans. Instrum. Meas., 58 (10): 3554-3568 (2009)A Statistical Study of De-Embedding Applied to Eye Diagram Analysis.P. Hale, J. Jargon, C. Wang, B. Grossman, M. Claudius, J. Torres, A. Dienstfrey, and D. Williams. IEEE Trans. Instrum. Meas., 61 (2): 475-488 (2012)Gradient-based Solution of Maximum Likelihood Angle Estimation for Virtual Array Measurements.P. Vouras, A. Weiss, M. Becker, B. Jamroz, J. Quimby, D. Williams, and K. Remley. GlobalSIP, page 1257-1261. IEEE, (2018)NIST-Traceable Microwave Power Measurement in a Waveguide Calorimeter With Correlated Uncertainties.D. Gu, X. Lu, B. Jamroz, D. Williams, X. Cui, and A. Sanders. IEEE Trans. Instrumentation and Measurement, 68 (6): 2280-2287 (2019)Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz.R. Jones, J. Cheron, B. Bosworth, B. Jamroz, D. Williams, M. Urteaga, A. Feldman, and P. Aaen. BCICTS, page 124-127. IEEE, (2023)On-Wafer Transistor Characterization to 750 GHz - the Approach, Results, and Pitfalls.D. Williams, J. Cheron, B. Jamroz, and R. Chamberlin. BCICTS, page 1-5. IEEE, (2018)

BibSonomy

Disambiguation of "Williams, Dylan F."

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Traceable Waveform Calibration With a Covariance-Based Uncertainty Analysis.

Please choose a person to relate this publication to

Simone Williams

Benjamin Williams

Jenny Williams

Lawrence Williams

Sam Dylan Moré

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Williams, Dylan F."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Traceable Waveform Calibration With a Covariance-Based Uncertainty Analysis.

Please choose a person to relate this publication to

Simone Williams

Benjamin Williams

Jenny Williams

Lawrence Williams

Sam Dylan Moré

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Traceable Waveform Calibration With a Covariance-Based Uncertainty Analysis.