( en | de | ru )

 

Disambiguation of "Motoyoshi, Mizuki"

Author of the publication

copydeleteadd this publication to your clipboard
Image Enhancement in 26GHz-Band 1-Bit Direct Digital RF Transmitter Using Manchester Coding.

, , , , and . IEICE Trans. Commun., 104-B (6): 654-663 (2021)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Mizuki Takenaka

 

Other publications of authors with the same name

Bias-Voltage-Dependent Subcircuit Model for Millimeter-Wave CMOS Circuit., , , , and . IEICE Trans. Electron., 95-C (6): 1077-1085 (2012)Theoretical Analysis of Center Frequency and Bandwidth Tunable Resonator Employing Coupled Line and Switches., , , , and . IEICE Trans. Electron., 102-C (8): 612-621 (2019)RF Signal Frequency Identification in a Direct RF Undersampling Multi-Band Real-Time Spectrum Monitor for Wireless IoT Usage., , , , and . IEICE Trans. Commun., 105-B (4): 461-471 (2022)A 60 GHz-band S/H CMOS IC for Direct RF Undersampling Receiver., , , , and . RWS, page 128-130. IEEE, (2022)125 GHz CMOS oscillator controlled by p-type bulk voltage., , , and . RWS, page 215-218. IEEE, (2012)Evaluation of Channel Capacity of Millimeter-Wave WBAN Considering Human Body Blocking in User-Dense Condition., , , , and . ICUFN, page 57-59. IEEE, (2019)60GHz 180µW Power Consumption CMOS ASK Transmitter Using Combined On-Chip Resonator and Antenna., , and . IEICE Trans. Electron., 102-C (10): 725-731 (2019)Analysis of De-Embedding Error Cancellation in Cascade Circuit Design., , , , and . IEICE Trans. Electron., 94-C (10): 1641-1649 (2011)Image Enhancement in 26GHz-Band 1-Bit Direct Digital RF Transmitter Using Manchester Coding., , , , and . IEICE Trans. Commun., 104-B (6): 654-663 (2021)4.8 GHz CMOS Frequency Multiplier Using Subharmonic Pulse-Injection Locking for Spurious Suppression., , and . IEICE Trans. Electron., 91-C (11): 1738-1743 (2008)