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Disambiguation of "Lu, Shyue-Kung"

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Online slack-time binning for IO-registered die-to-die interconnects.

, , , , , and . ITC, page 1-8. IEEE, (2016)

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Lu Lu

Zigmas Kungys

Hans Kungl

Angela Brigitte Kung

Ingshen Kung

 

Other publications of authors with the same name

Combinational circuit fault diagnosis using logic emulation., , , , and . ISCAS (5), page 549-552. IEEE, (2003)A defect level monitor of resistive open defect at interconnects in 3D ICs by injected charge volume., , , , and . ISCIT, page 1-5. IEEE, (2017)Efficient test and repair architectures for 3D TSV-based random access memories., , , and . VLSI-DAT, page 1-4. IEEE, (2013)Hybrid scrambling technique for increasing the fabrication yield of NROM-Based ROMs., , , and . VLSI-DAT, page 1-4. IEEE, (2015)A built-in supply current test circuit for electrical interconnect tests of 3D ICs., , , and . 3DIC, page 1-6. IEEE, (2014)Fault-Aware Dependability Enhancement Techniques for Flash Memories., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 28 (3): 634-645 (2020)Enhanced Interconnect Test Method for Resistive Open Defects in Final Tests with Relaxation Oscillators., , , , , and . ATS, page 49-53. IEEE, (2022)Integrated Progressive Built-In Self-Repair (IPBISR) Techniques for NAND Flash Memory., and . ITC-Asia, page 1-6. IEEE, (2023)Scrambling and Data Inversion Techniques for Yield Enhancement of NROM-Based ROMs., , and . Asian Test Symposium, page 308-313. IEEE Computer Society, (2012)A defective level monitor of open defects in 3D ICs with a comparator of offset cancellation type., , , and . DFT, page 1-4. IEEE Computer Society, (2017)