( en | de | ru )

 

Disambiguation of "Mateo, Diego"

Author of the publication

copydeleteadd this publication to your clipboard
An Ultra Low-Voltage RF Front-end Receiver for IoT Devices.

, , , , and . PRIME, page 161-164. IEEE, (2022)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Ana Maria Mateo Rosell

Alexander Diego

Carlos Mateo Balmelli

Jesús Diego Linares

Mateo Hermel

 

Other publications of authors with the same name

Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling., , , , , , and . ISCAS, page 1-5. IEEE, (2019)Discrete and continuous substrate noise spectrum dependence on digital circuit characteristics., , , , , and . ISCAS (5), page 4273-4276. IEEE, (2005)Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology., , , , , , , , , and 2 other author(s). PATMOS, page 82-87. IEEE, (2018)Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology., , , and . Sensors, 19 (21): 4815 (2019)Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes., , , , , , , , , and 7 other author(s). MWSCAS, page 1081-1084. IEEE, (2014)A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging., , , , , , , , , and . SMACD, page 1-4. IEEE, (2017)On line monitoring of RF power amplifiers with embedded temperature sensors., , and . IOLTS, page 109-113. IEEE Computer Society, (2012)BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits., , , , , , and . Sensors, 21 (3): 805 (2021)Sargantana: An Academic SoC RISC-V Processor in 22nm FDSOI Technology., , , , , , , , , and 38 other author(s). DCIS, page 1-6. IEEE, (2023)Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation., , , , , , and . IRPS, page 1-7. IEEE, (2020)