( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults.

, и . IEEE Trans. Computers, 30 (8): 600-604 (1981)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Yashwant Gopal Palshikar

Aman K K Bhasin

K Amann

K Dugaev

K Pillen

 

Другие публикации лиц с тем же именем

An Examination of Fault Exposure Ratio., , и . IEEE Trans. Software Eng., 19 (11): 1087-1094 (1993)Testing for Timing Faults in Synchronous Sequential Integrated Circuits., и . ITC, стр. 560-573. IEEE Computer Society, (1983)An Introduction to Software Reliability Models., и . Int. CMG Conference, стр. 1237-1239. Computer Measurement Group, (1991)Testable design of BiCMOS circuits for stuck-open fault detection using single patterns., , , и . IEEE J. Solid State Circuits, 30 (8): 855-863 (августа 1995)Dynamic power minimization during combinational circuit testing as a traveling salesman problem., , , и . Congress on Evolutionary Computation, стр. 1088-1095. IEEE, (2005)Modeling the Vulnerability Discovery Process., и . ISSRE, стр. 129-138. IEEE Computer Society, (2005)Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing., , , , и . ITC, стр. 467-476. IEEE Computer Society, (2010)Use of Storage Elements as Primitives for Modelling Faults in Synchronous Sequential Circuits., , и . VLSI Design, стр. 118-123. IEEE Computer Society, (1993)Security Vulnerabilities in Software Systems: A Quantitative Perspective., , и . DBSec, том 3654 из Lecture Notes in Computer Science, стр. 281-294. Springer, (2005)Automatic test generation using checkpoint encoding and antirandom testing., , и . ISSRE, стр. 84-95. IEEE Computer Society, (1997)