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Minimization of maximum electric field in high-voltage parallel-plate capacitor., , and . MIPRO, page 99-103. IEEE, (2016)Measurement of thermal boundary resistance in AlGaN/GaN HEMTs using Liquid Crystal Thermography., , , , , and . MIPRO, page 48-53. IEEE, (2012)Study of leakage current mechanisms in ballistic deflection transistors., , and . ACM Great Lakes Symposium on VLSI, page 165-168. ACM, (2009)6-bit low power low area frequency modulation based flash ADC., and . ISCAS (1), page 137-140. IEEE, (2004)Process tolerant calibration circuit for PLL applications with BIST., , , and . ISCAS, IEEE, (2006)1.8V 0.18µm CMOS Novel Successive Approximation ADC., , and . VLSI-SOC, page 375-379. Technische Universität Darmstadt, Insitute of Microelectronic Systems, (2003)Ballistic Deflection Transistors and the Emerging Nanoscale Era., , , , , and . ISCAS, page 61-64. IEEE, (2009)A New Test Methodology For DNL Error In Flash ADC's., , , and . DFT, page 582-590. IEEE Computer Society, (2005)Deep-Submicron CMOS Design Methodology for High-Performance Low-Power Analog-to-Digital Converters., , and . VLSI-SOC, page 380-385. Technische Universität Darmstadt, Insitute of Microelectronic Systems, (2003)