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A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories., , , , и . IEEE Trans. Very Large Scale Integr. Syst., 19 (12): 2184-2194 (2011)A single-machine scheduling with a truncated linear deterioration and ready times., , , , , и . Inf. Sci., (2014)Some two-agent single-machine scheduling problems to minimize minmax and minsum of completion times., , , и . Operational Research, 18 (2): 293-314 (2018)A tabu method for a two-agent single-machine scheduling with deterioration jobs., , , , , и . Comput. Oper. Res., 40 (8): 2116-2127 (2013)The single-machine total tardiness problem with unequal release times and a linear deterioration., , , , и . Appl. Math. Comput., 219 (20): 10401-10415 (2013)MRAM Defect Analysis and Fault Modeli., , , , , , и . ITC, стр. 124-133. IEEE Computer Society, (2004)A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories., , , , и . MTDT, стр. 65-69. IEEE Computer Society, (2004)Diagnosis of MRAM Write Disturbance Fault., , , , , , , , и . IEEE Trans. Very Large Scale Integr. Syst., 18 (12): 1762-1766 (2010)A branch-and-bound procedure for a single-machine earliness scheduling problem with two agents., , , , и . Appl. Soft Comput., 13 (2): 1042-1054 (2013)A study of the single-machine two-agent scheduling problem with release times., , , , и . Appl. Soft Comput., 13 (2): 998-1006 (2013)