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Understanding customer returns from a test perspective., , , , and . VTS, page 2-7. IEEE Computer Society, (2011)A Novel Peak Power Supply Noise Measurement and Adaptation System for Integrated Circuits., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 24 (5): 1715-1727 (2016)Outsourcing DFT: it can be done but it isn't easy.. ITC, page 2. IEEE Computer Society, (2005)A robust digital sensor IP and sensor insertion flow for in-situ path timing slack monitoring in SoCs., , and . VTS, page 1-6. IEEE Computer Society, (2015)Learning the process for correlation analysis., , , and . VTS, page 1-6. IEEE Computer Society, (2017)Special session 5B: Panel How much toggle activity should we be testing with?, , , , , and . VTS, page 114. IEEE Computer Society, (2011)Some considerations on choosing an outlier method for automotive product lines., , , , , and . ITC, page 1-10. IEEE, (2017)Design and Analysis of a Delay Sensor Applicable to Process/Environmental Variations and Aging Measurements., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 20 (8): 1405-1418 (2012)SoC Speed Binning Using Machine Learning and On-Chip Slack Sensors., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (5): 842-854 (2017)On-chip sensor selection for effective speed-binning., , , and . MWSCAS, page 1073-1076. IEEE, (2014)