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Performances VS Reliability: how to exploit Approximate Computing for Safety-Critical applications., , , and . IOLTS, page 291-294. IEEE, (2018)A two-layer SPICE model of the ATMEL TSTACTM eFlash memory technology for defect injection and faulty behavior prediction., , , , , , , , and . European Test Symposium, page 81-86. IEEE Computer Society, (2010)Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes., , , , , , and . European Test Symposium, page 132-137. IEEE Computer Society, (2010)A dynamic programming algorithm for the single-machine scheduling problem with deteriorating processing times., and . Electron. Notes Discret. Math., (2006)Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 21 (5): 958-970 (2013)Investigating data representation for efficient and reliable Convolutional Neural Networks., , , , and . Microprocess. Microsystems, (October 2021)SyRA: Early System Reliability Analysis for Cross-Layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems., , , , , , , , , and 4 other author(s). IEEE Trans. Computers, 68 (5): 765-783 (2019)Approximations in Deep Learning., , , , , and . CoRR, (2022)High-Performance Data Mapping for BNNs on PCM-based Integrated Photonics., , , , , and . CoRR, (2024)Test and Reliability in Approximate Computing., , , , and . J. Electron. Test., 34 (4): 375-387 (2018)