Autor der Publikation

Bitte wählen Sie eine Person um die Publikation zuzuordnen

Um zwischen Personen mit demselben Namen zu unterscheiden, wird der akademische Grad und der Titel einer wichtigen Publikation angezeigt. Zudem lassen sich über den Button neben dem Namen einige der Person bereits zugeordnete Publikationen anzeigen.

 

Weitere Publikationen von Autoren mit dem selben Namen

Dual-Loaded Modulated Dipole Scatterer as an Embedded Sensor., , , und . IEEE Trans. Instrumentation and Measurement, 60 (5): 1884-1892 (2011)Novel and Simple High-Frequency Single-Port Vector Network Analyzer., , , und . IEEE Trans. Instrumentation and Measurement, 59 (3): 534-542 (2010)Accurate Microwave Measurement of Coating Thickness on Carbon Composite Substrates., , und . IEEE Trans. Instrumentation and Measurement, 65 (4): 951-953 (2016)Comparison of near-field millimeter-wave probes for detecting corrosion precursor pitting under paint., , , und . IEEE Trans. Instrumentation and Measurement, 54 (4): 1497-1504 (2005)Near-Field Millimeter-Wave Imaging of Exposed and Covered Fatigue Cracks., , und . IEEE Trans. Instrumentation and Measurement, 58 (7): 2367-2370 (2009)Accurate One-Sided Microwave Thickness Evaluation of Lined-Fiberglass Composites., , , , , und . IEEE Trans. Instrumentation and Measurement, 64 (10): 2802-2812 (2015)Broadband dual varactor diode-loaded elliptical slot antenna with an orthogonal feed at K-band., , und . I2MTC, Seite 635-640. IEEE, (2013)Microwave near-field reflection property analysis of concrete for material content determination., , und . IEEE Trans. Instrumentation and Measurement, 49 (1): 49-55 (2000)Multimode solution for the reflection properties of an open-ended rectangular waveguide radiating into a dielectric half-space: the forward and inverse problems., , und . IEEE Trans. Instrumentation and Measurement, 48 (6): 1131-1140 (1999)Semiempirical electromagnetic modeling of crack detection and sizing in cement-based materials using near-field microwave methods., , und . IEEE Trans. Instrumentation and Measurement, 55 (2): 588-597 (2006)