Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Manufacturability and Testability Oriented Synthesis., , and . VLSI Design, page 185-191. IEEE Computer Society, (2000)Memory Yield Improvement - SoC Design Perspective.. ITC, page 1445. IEEE Computer Society, (2004)Design for manufacturability in submicron domain., , , and . ICCAD, page 690-697. IEEE Computer Society / ACM, (1996)Test and Debug of Networking SoCs: A Case Study., , , and . VTS, page 121-126. IEEE Computer Society, (2000)CAD at the Design-Manufacturing Interface., , , , , and . DAC, page 321-326. ACM Press, (1997)Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring., , , , , and . ITC, page 258-267. IEEE Computer Society, (2001)Testability-oriented channel routing., , , , and . VLSI Design, page 208-213. IEEE Computer Society, (1995)Inductive Contamination Analysis (ICA) with SRAM Application., and . ITC, page 552-560. IEEE Computer Society, (1995)Design-Manufacturing Interface: Part II - Applications., , , , , and . DATE, page 557-562. IEEE Computer Society, (1998)DFM - A Fabless Perspective.. ITC, page 1317. IEEE Computer Society, (2003)