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Disambiguation of "Mak, Pui-In"

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A 0.3-V, 37.5-nW 1.5∼6.5-pF-input-range supply voltage tolerant capacitive sensor readout.

, , , and . ISIC, page 388-391. IEEE, (2014)

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Ellen Mak

Beatrice Puiu

Rebecca Mak

Kwok Mak

Ale PuÌ

 

Other publications of authors with the same name

Simple-Logic Comparator-Offset Mitigation Technique for Resistor-Based Temperature Sensor in DFLL., , , and . ICTA, page 1-2. IEEE, (2023)3.9 An RF-to-BB current-reuse wideband receiver with parallel N-path active/passive mixers and a single-MOS pole-zero LPF., , and . ISSCC, page 74-75. IEEE, (2014)A 47nW Mixed-Signal Voice Activity Detector (VAD) Featuring a Non-Volatile Capacitor-ROM, a Short-Time CNN Feature Extractor and an RNN Classifier., , , , and . ISSCC, page 214-215. IEEE, (2023)10.9 A 23.2-to-26GHz Sub-Sampling PLL Achieving 48.3fsrms Jitter, -253.5dB FoMJ, and 0.55μs Locking Time Based on a Function-Reused VCO-Buffer and a Type-I FLL with Rapid Phase Alignment., , , , , and . ISSCC, page 204-206. IEEE, (2024)34.6 A 28nm 72.12TFLOPS/W Hybrid-Domain Outer-Product Based Floating-Point SRAM Computing-in-Memory Macro with Logarithm Bit-Width Residual ADC., , , , , , , , , and 5 other author(s). ISSCC, page 576-578. IEEE, (2024)Energy Optimized Subthreshold VLSI Logic Family With Unbalanced Pull-Up/Down Network and Inverse Narrow-Width Techniques., , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 23 (12): 3119-3123 (2015)A 0.003-mm2 440fsRMS-Jitter and -64dBc-Reference-Spur Ring-VCO-Based Type-I PLL Using a Current-Reuse Sampling Phase Detector in 28-nm CMOS., , , and . A-SSCC, page 283-284. IEEE, (2019)A 0.038-mm2 SAW-Less Multiband Transceiver Using an N-Path SC Gain Loop., , and . IEEE J. Solid State Circuits, 52 (8): 2055-2070 (2017)A Handheld High-Sensitivity Micro-NMR CMOS Platform With B-Field Stabilization for Multi-Type Biological/Chemical Assays., , , , , and . IEEE J. Solid State Circuits, 52 (1): 284-297 (2017)A 0.46-mm 2 4-dB NF Unified Receiver Front-End for Full-Band Mobile TV in 65-nm CMOS., and . IEEE J. Solid State Circuits, 46 (9): 1970-1984 (2011)