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A statistical study of defect maps of large area VLSI IC's.

, , and . IEEE Trans. Very Large Scale Integr. Syst., 2 (2): 249-256 (1994)

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On Fractal Yield Models: A Statistical Paradox., and . DFT, page 83-87. IEEE Computer Society, (1994)A statistical study of defect maps of large area VLSI IC's., , and . IEEE Trans. Very Large Scale Integr. Syst., 2 (2): 249-256 (1994)Yield Model for ASIC and Processor Chips., , and . DFT, page 136-143. IEEE Computer Society, (1993)A New Statistical Approach for Fault-Tolerant VLSI Systems.. FTCS, page 356-365. IEEE Computer Society, (1992)Yield of VLSI circuits: myths vs. reality (panel)., , , , and . DAC, page 234-235. IEEE Computer Society Press, (1986)