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Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage.

, , , , , , and . J. Sensors, (2016)

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Research on proton radiation effects on CMOS image sensors with experimental and particle transport simulation methods., , , , , , , , and . Sci. China Inf. Sci., 60 (12): 120402:1-120402:3 (2017)Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage., , , , , , and . J. Sensors, (2016)The Total Ionizing Dose Effects on Perovskite CsPbBr3 Semiconductor Detector., , , , , , , and . Sensors, 23 (4): 2017 (February 2023)Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors., , , , , , , , , and 1 other author(s). Sci. China Inf. Sci., 62 (6): 69403:1-69403:3 (2019)Effect of 60Coγ ray radiation on electrical properties of SiGe HBTs at low temperatures., , , , , , , , , and 1 other author(s). Microelectron. J., (February 2024)Proton Radiation Effects on Dark Signal Distribution of PPD CMOS Image Sensors: Both TID and DDD Effects., , , , , , , , , and . Sensors, 17 (12): 2781 (2017)Impact of thermal baking before radiation on the total dose response of bipolar device., , , , , , , and . Microelectron. J., (2023)Modeling dark signal of CMOS image sensors irradiated by reactor neutron using Monte Carlo method., , , , , , , , , and . Sci. China Inf. Sci., 61 (6): 062405:1-062405:10 (2018)