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Microcomputer-Based, Gracefully Degrading Industrial Controller., and . Fehlertolerierende Rechensysteme, volume 214 of Informatik-Fachberichte, page 124-133. Springer, (1989)Estimating the effect of single-event upsets on microprocessors., , and . DFT, page 185-190. IEEE Computer Society, (2014)AMD EPYC™ 7002 Series - A Processor with Improved Soft Error Resilience.. DSN (Supplements), page 33-36. IEEE, (2021)Impact of Deep Submicron Technology on Dependability of VLSI Circuits.. DSN, page 205-209. IEEE Computer Society, (2002)Silent Data Corruption - Myth or reality?, , , and . DSN, page 108-109. IEEE Computer Society, (2008)Neutron SER Characterization of Microprocessors.. DSN, page 754-759. IEEE Computer Society, (2005)Validation of the Fault/Error Handling Mechanisms of the Teraflops Supercomputer.. FTCS, page 382-389. IEEE Computer Society, (1998)Using Physical and Simulated Fault Injection to Evaluate Error Detection Mechanisms.. PRDC, page 186-192. IEEE Computer Society, (1999)Dependability Benchmarking of Computing Systems - Panel Statement., , , , , and . DSN, page 400. IEEE Computer Society, (2005)A Fault-Tolerant Microcomputer for Advanced Control: Architecture and Performability Analysis., and . RTSS, page 222-228. IEEE Computer Society, (1989)