( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Detection & isolation of sensor and actuator additive faults in a 4-mecanum wheeled mobile robot (4-MWMR).

, , , , и . ICCAD, стр. 1-6. IEEE, (2019)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Mustapha Benchikh

Mustapha Djebari

Mustapha Sayed

Mustapha Maalej

Mustapha Fikri

 

Другие публикации лиц с тем же именем

Fault Detection for Switching Discrete-Time Systems with External Disturbance., , и . CSSP, 34 (7): 2127-2140 (2015)Fault tolerant control for switching discrete-time systems with delays: an improved cone complementarity approach., , и . Int. J. Systems Science, 45 (10): 2116-2126 (2014)Modeling and nonlinear control of magnetic levitation systems., и . IEEE Trans. Ind. Electron., 48 (4): 831-838 (2001)Evaluation of Alarm System Performance and Management in Semiconductor Manufacturing., , , , и . CoDIT, стр. 1155-1160. IEEE, (2019)Improving the GRLVQ Algorithm by the Cross Entropy Method., , и . ICANN (1), том 4668 из Lecture Notes in Computer Science, стр. 199-208. Springer, (2007)Development of flying qualities based charts as a support for the initialization of the gains of helicopter control laws., , , и . CCA, стр. 445-450. IEEE, (2014)Computationally Efficient Algorithm for Atrial Fibrillation Detection using Linear and Geometric Features of RR Time-Series Derivatives., , и . ICCAD, стр. 1-6. IEEE, (2022)From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry., , , , и . ECC, стр. 1768-1773. IEEE, (2021)Application of Principal Components Analysis to improve fault detection and diagnosis on semiconductor manufacturing equipment., , и . ECC, стр. 1445-1450. IEEE, (2013)A Comparative Evaluation of Deep Learning Anomaly Detection Techniques on Semiconductor Multivariate Time Series Data., , , и . CASE, стр. 1613-1620. IEEE, (2021)