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Study of the Impact of Hardware Fault on Software Reliability.

, , , , and . ISSRE, page 63-72. IEEE Computer Society, (2005)

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Combined Channel Segmentation and Buffer Insertion for Routability and Performance Improvement of Field., , , and . ICCD, page 490-495. IEEE Computer Society, (2004)Microelectronics reliability : physics-of-failure based modeling and lifetime evaluation, and . Jet Propulsion Laboratory, National Aeronautics and Space Administration, Pasadena, CA, (2008)The Correct Hot Carrier Degradation Model., , and . IRPS, page 1-5. IEEE, (2023)Laser formed connections for programmable wiring., , and . CICC, page 163-165. IEEE, (1998)Study of the Impact of Hardware Fault on Software Reliability., , , , and . ISSRE, page 63-72. IEEE Computer Society, (2005)The Effects of Process Variations and BTI in Packaged FinFET Devices., , and . IRPS, page 1-5. IEEE, (2023)An improved reliability model for Si and GaN power FET., , , , and . Microelectron. Reliab., (2018)Structural health monitoring of solder joints in QFN package., and . Microelectron. Reliab., 52 (12): 3011-3016 (2012)Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature., , and . ISQED, page 496-502. IEEE Computer Society, (2005)A High Performance Radiation-Hard Field Programmable Analog Array ., , , , , and . ISQED, page 522-527. IEEE Computer Society, (2004)