Author of the publication

Learning-Based Grey Wolf Optimizer for Stochastic Flexible Job Shop Scheduling.

, , and . IEEE Trans Autom. Sci. Eng., 19 (4): 3659-3671 (2022)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

An Adaptive Scheduling Algorithm for Dynamic Jobs for Dealing with the Flexible Job Shop Scheduling Problem., , , and . Bus. Inf. Syst. Eng., 61 (3): 299-309 (2019)Two-Stage Genetic Algorithm for Scheduling Stochastic Unrelated Parallel Machines in a Just-in-Time Manufacturing Context., , , , and . IEEE Trans Autom. Sci. Eng., 20 (2): 936-949 (April 2023)Task Allocation Method of Multi-Logistics Robots Based on Autoencoder-Embedded Genetic Algorithm., and . CASE, page 1-6. IEEE, (2023)A Self-Adaptive Cuckoo Search Algorithm for Energy Consumption Minimization Problem with Deadline Constraint., , , and . CASE, page 1479-1484. IEEE, (2020)A Cuckoo Search-Based Scheduling Algorithm for a Semiconductor Production Line with Constrained Waiting Time., , , and . CASE, page 338-343. IEEE, (2019)Scheduling Semiconductor Testing Facility by Using Cuckoo Search Algorithm With Reinforcement Learning and Surrogate Modeling., , , and . IEEE Trans Autom. Sci. Eng., 16 (2): 825-837 (2019)Learning-Based Cuckoo Search Algorithm to Schedule a Flexible Job Shop With Sequencing Flexibility., , and . IEEE Trans. Cybern., 53 (10): 6663-6675 (October 2023)Reinforcement-Learning-Based Local Search Approach to Integrated Order Batching: Driving Growth for Logistics and Retail., , and . IEEE Robotics Autom. Mag., 30 (2): 34-45 (June 2023)Solving an order batching, picker assignment, batch sequencing and picker routing problem via information integration., , , and . J. Ind. Inf. Integr., (February 2023)An improved cuckoo search algorithm for semiconductor final testing scheduling., , , and . CASE, page 1040-1045. IEEE, (2017)