( en | de | ru )

 

Disambiguation of "Toledano-Luque, Maria"

Author of the publication

copydeleteadd this publication to your clipboard
Defect-centric perspective of time-dependent BTI variability.

, , , , , and . Microelectron. Reliab., 52 (9-10): 1883-1890 (2012)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Alejandro Luque Estepa

Maria José Arrabali Luque-Mäder

Manuel Mariadasa

Petra Marialke-Kandaouroff

Boris Mariacher

 

Other publications of authors with the same name

Reliability impact of advanced doping techniques for DRAM peripheral MOSFETs., , , , , , , and . ICICDT, page 1-4. IEEE, (2015)Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations., , , , , , , , and . Microelectron. Reliab., 54 (9-10): 2258-2261 (2014)As-grown donor-like traps in low-k dielectrics and their impact on intrinsic TDDB reliability., , , , , , , , , and 1 other author(s). Microelectron. Reliab., 54 (9-10): 1675-1679 (2014)Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes., , , , , , , , , and 5 other author(s). Microprocess. Microsystems, 39 (8): 1039-1051 (2015)Defect-centric perspective of time-dependent BTI variability., , , , , and . Microelectron. Reliab., 52 (9-10): 1883-1890 (2012)Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area., , , , , , , and . IRPS, page 1-6. IEEE, (2021)Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs., , , , , , , , , and 1 other author(s). IRPS, page 1-6. IEEE, (2019)Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications., , , , , , , , , and 6 other author(s). ICICDT, page 1-4. IEEE, (2012)Self-heating characterization and its applications in technology development., , , , , , , , , and 8 other author(s). NATW, page 1-7. IEEE, (2020)