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Computing reliability: On the differences between software testing and software fault injection techniques., , , , , и . Microprocess. Microsystems, (2017)Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview., , , , , , , , , и 1 other автор(ы). Microprocess. Microsystems, 39 (8): 1204-1214 (2015)SECCS: SECure Context Saving for IoT Devices., , , , , и . CoRR, (2019)HATE: a HArdware Trojan Emulation Environment for Microprocessor-based Systems., , , , , и . IOLTS, стр. 109-114. IEEE, (2019)On-chip test comparison for protecting confidential data in secure ICs., , , и . European Test Symposium, стр. 1. IEEE Computer Society, (2012)Experimentations on scan chain encryption with PRESENT., , , и . IVSW, стр. 45-50. IEEE, (2017)A New Secure Stream Cipher for Scan Chain Encryption., , , , , и . IVSW, стр. 68-73. IEEE, (2018)Reliability of computing systems: From flip flops to variables., , , , и . IOLTS, стр. 196-198. IEEE, (2017)Laser-Induced Fault Effects in Security-Dedicated Circuits., , , , , , , , , и 5 other автор(ы). VLSI-SoC (Selected Papers), том 464 из IFIP Advances in Information and Communication Technology, стр. 220-240. Springer, (2014)Frontside Versus Backside Laser Injection: A Comparative Study., , , , и . JETC, 13 (1): 6:1-6:15 (2016)