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An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection.

C. Chang, J. Chang, and M. Jeng. ICRA, page 3000-3005. IEEE, (2005)

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Jia Wei

Wei Jia

Jia-Kang Chang

Wei-Hsin Chang

Che-Wei Chang

Other publications of authors with the same name

A Deep Convolutional Neural Network based Chinese Menu Recognition App.M. Lee, S. Chiu, and J. Chang. Inf. Process. Lett., (2017)Enabling Intelligent Environment by the Design of Emotionally Aware Virtual Assistant: A Case of Smart Campus.P. Chiu, J. Chang, M. Lee, C. Chen, and D. Lee. IEEE Access, (2020)Music recommender using deep embedding-based features and behavior-based reinforcement learning.J. Chang, C. Chiou, J. Liao, Y. Hung, C. Huang, K. Lin, and Y. Pu. Multim. Tools Appl., 80 (26): 34037-34064 (2021)A Deep Convolutional Neural Network Based Virtual Elderly Companion Agent.M. Lee, S. Yeh, S. Chiu, and J. Chang. MMSys, page 235-238. ACM, (2017)The Effects of Fusing 635 Brainstorming and C-Sketch Methods on the Creativity of Industrial Design.C. Hsu, T. Wang, K. Lin, and J. Chang. ICALT, page 189-193. IEEE Computer Society, (2017)Improving of Segmental LMR-Mapping Based Voice Conversion Method.H. Gu, and J. Chang. IJCLCLP, (2013)An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection.C. Chang, J. Chang, and M. Jeng. ICRA, page 3000-3005. IEEE, (2005)Using a self-organizing neural network for wafer defect inspection.C. Chang, J. Chang, and M. Jeng. SMC (5), page 4312-4317. IEEE, (2004)Exploring the distributed learning on federated learning and cluster computing via convolutional neural networks.J. Chang, J. Hung, and T. Chu. Neural Comput. Appl., 36 (5): 2141-2153 (February 2024)Applying attention-based BiLSTM and technical indicators in the design and performance analysis of stock trading strategies.M. Lee, J. Chang, S. Yeh, T. Chia, J. Liao, and X. Chen. Neural Comput. Appl., 34 (16): 13267-13279 (2022)

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Disambiguation of "Chang, Jia-Wei"

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An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection.

Please choose a person to relate this publication to

Jia Wei

Wei Jia

Jia-Kang Chang

Wei-Hsin Chang

Che-Wei Chang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Chang, Jia-Wei"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection.

Please choose a person to relate this publication to

Jia Wei

Wei Jia

Jia-Kang Chang

Wei-Hsin Chang

Che-Wei Chang

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection.