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Multi-Resolution Data Fusion for Super-Resolution Electron Microscopy.

S. Sreehari, S. Venkatakrishnan, K. Bouman, J. Simmons, L. Drummy, и C. Bouman. CVPR Workshops, стр. 1084-1092. IEEE Computer Society, (2017)

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Multi-resolution Data Fusion for Super-Resolution Electron Microscopy.S. Sreehari, S. Venkatakrishnan, K. Bouman, J. Simmons, L. Drummy, и C. Bouman. CoRR, (2016)Advanced prior modeling for 3D bright field electron tomography.S. Sreehari, S. Venkatakrishnan, L. Drummy, J. Simmons, и C. Bouman. Computational Imaging, том 9401 из SPIE Proceedings, стр. 940108. IS&T/SPIE, (2015)A Model Based Iterative Reconstruction Algorithm For High Angle Annular Dark Field-Scanning Transmission Electron Microscope (HAADF-STEM) Tomography.S. Venkatakrishnan, L. Drummy, M. Jackson, M. Graef, J. Simmons, и C. Bouman. IEEE Trans. Image Process., 22 (11): 4532-4544 (2013)Multi-Resolution Data Fusion for Super Resolution Imaging.E. Reid, G. Buzzard, L. Drummy, и C. Bouman. (мая 2022)Physics-Based Regularizer for Joint Soft Segmentation and Reconstruction of Electron Microscopy Images of Polycrystalline Microstructures.A. Ziabari, J. Rickman, L. Drummy, J. Simmons, и C. Bouman. IEEE Trans. Computational Imaging, 5 (4): 660-674 (2019)Model-Based Iterative Reconstruction for Bright-Field Electron Tomography.S. Venkatakrishnan, L. Drummy, M. Jackson, M. Graef, J. Simmons, и C. Bouman. IEEE Trans. Computational Imaging, 1 (1): 1-15 (2015)Multi-Resolution Data Fusion for Super-Resolution Electron Microscopy.S. Sreehari, S. Venkatakrishnan, K. Bouman, J. Simmons, L. Drummy, и C. Bouman. CVPR Workshops, стр. 1084-1092. IEEE Computer Society, (2017)Bayesian image segmentation of transmission electron tomography 3D reconstructions.L. Drummy. SSP, стр. 676-679. IEEE, (2012)Effective Super-Resolution Methods for Paired Electron Microscopic Images.Y. Qian, J. Xu, L. Drummy, и Y. Ding. IEEE Trans. Image Process., (2020)Rotationally-invariant non-local means for image denoising and tomography.S. Sreehari, S. Venkatakrishnan, L. Drummy, J. Simmons, и C. Bouman. ICIP, стр. 542-546. IEEE, (2015)

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