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Accurate Prediction of Random Telegraph Noise Effects in SRAMs and DRAMs.

, , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 32 (1): 73-86 (2013)

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SRAM read current variability and its dependence on transistor statistics., , , , , , and . CICC, page 1-4. IEEE, (2013)BSIM - Industry standard compact MOSFET models., , , , , , , and . ESSCIRC, page 30-33. IEEE, (2012)BSIM - SPICE Models Enable FinFET and UTB IC Designs., , , , , , and . IEEE Access, (2013)Flicker noise in advanced CMOS technology: Effects of halo implant., , , , , , , and . ESSDERC, page 238-241. IEEE, (2013)A non-iterative physical procedure for RF CMOS compact model extraction using BSIM6., , , , , , , and . CICC, page 1-4. IEEE, (2012)Evaluation of the BSIM6 compact MOSFET model's scalability in 40nm CMOS technology., , , , , , , and . ESSCIRC, page 34-37. IEEE, (2012)BSIM compact MOSFET models for SPICE simulation., , , , , , , , , and 1 other author(s). MIXDES, page 23-28. IEEE, (2013)Accurate Prediction of Random Telegraph Noise Effects in SRAMs and DRAMs., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 32 (1): 73-86 (2013)SAMURAI: An accurate method for modelling and simulating non-stationary Random Telegraph Noise in SRAMs., , , and . DATE, page 1113-1118. IEEE, (2011)MUSTARD: a coupled, stochastic/deterministic, discrete/continuous technique for predicting the impact of random telegraph noise on SRAMs and DRAMs., , , and . DAC, page 292-297. ACM, (2011)