( en | de | ru )

 

Disambiguation of "Seth, Sharad C."

Author of the publication

copydeleteadd this publication to your clipboard
STEM: Spatiotemporal Management of Capacity for Intra-core Last Level Caches.

, , and . MICRO, page 163-174. IEEE Computer Society, (2010)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Sharad Chandra

Sharad Prasad

Thomas Seth

Seth Nzahumunyurwa

Deep Seth

 

Other publications of authors with the same name

Clock partitioning for testability., , and . Great Lakes Symposium on VLSI, page 42-46. IEEE, (1993)Diagnosis of Faults in Linear Tree Networks., and . IEEE Trans. Computers, 26 (1): 29-33 (1977)A nonparametric classifier for unsegmented text., , , , , , and . DRR, volume 5296 of SPIE Proceedings, page 102-108. SPIE, (2004)Estimating the Quality of Manufactured Digital Sequential Circuits., , and . ITC, page 210-217. IEEE Computer Society, (1991)High-level microprogramming: an optimizing C compiler for a processing element of a CAD accelerator., , and . MICRO, page 97-106. ACM/IEEE, (1990)Table headers: An entrance to the data mine., and . ICPR, page 4065-4070. IEEE, (2016)Accurate computation of field reject ratio based on fault latency., , and . IEEE Trans. Very Large Scale Integr. Syst., 1 (4): 537-545 (1993)A system for recognizing a large class of engineering drawings., , and . IEEE Trans. Pattern Anal. Mach. Intell., 19 (8): 868-890 (1997)Programming pipelined CAD applications on message-passing architectures., , , , , and . Concurr. Pract. Exp., 7 (4): 315-337 (1995)Predicting Fault Coverage from Probabilistic Testability.. ITC, page 803-807. IEEE Computer Society, (1985)