( en | de | ru )

 

Disambiguation of "Kundu, Subhadip"

Author of the publication

copydeleteadd this publication to your clipboard
Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors.

, , and . ITC, page 1-7. IEEE, (2016)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Subhadip Chakrabarti

Arijit Kundu

Shankhamala Kundu

Sudip Kundu

Sudipta Kundu

 

Other publications of authors with the same name

Particle Swarm Optimization Based BIST Design for Memory Cores in Mesh Based Network-on-Chip., , , and . VDAT, volume 7373 of Lecture Notes in Computer Science, page 343-349. Springer, (2012)A Metric for Test Set Characterization and Customization Toward Fault Diagnosis., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 32 (11): 1824-1828 (2013)Customizing pattern set for test power reduction via improved X-identification and reordering., , , and . ISLPED, page 177-182. ACM, (2010)A Novel Technique to Reduce both Leakage and Peak Power during Scan Testing., , and . ICIIS, page 1-6. IEEE, (2008)Post-Silicon Validation and Diagnosis., and . VLSID, page 9-10. IEEE Computer Society, (2016)Fault diagnosis in designs with extreme low pin test data compressors., , and . DATE, page 1285-1288. ACM, (2015)Thermal Aware Don't Care Filling to Reduce Peak Temperature and Thermal Variance during Testing., , and . Asian Test Symposium, page 25-30. IEEE Computer Society, (2013)Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (3): 696-700 (2014)A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection., , , and . VLSI Design, page 436-441. IEEE Computer Society, (2012)Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption., , and . Asian Test Symposium, page 307-312. IEEE Computer Society, (2009)