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Coverage loss by using space compactors in presence of unknown values.

, , , , and . DATE, page 1053-1054. European Design and Automation Association, Leuven, Belgium, (2006)

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ATPG for Heat Dissipation Minimization During Test Application., and . IEEE Trans. Computers, 47 (2): 256-262 (1998)A BIST TPG for Low Power Dissipation and High Fault Coverage.. IEEE Trans. Very Large Scale Integr. Syst., 15 (7): 777-789 (2007)Re-configurable embedded core test protocol., , and . ASP-DAC, page 234-237. IEEE Computer Society, (2004)XWRC: externally-loaded weighted random pattern testing for input test data compression., , and . ITC, page 10. IEEE Computer Society, (2005)Efficient unknown blocking using LFSR reseeding., , and . DATE, page 1051-1052. European Design and Automation Association, Leuven, Belgium, (2006)Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns., and . ETS, page 125-130. IEEE Computer Society, (2008)A Low Hardware Overhead Self-Diagnosis Technique Using Reed-Solomon Codes for Self-Repairing Chips., and . IEEE Trans. Computers, 59 (10): 1309-1319 (2010)A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (8): 1555-1564 (2006)A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limited Capture., and . ASP-DAC, page 810-816. IEEE Computer Society, (2007)Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage., , , and . VLSI Design, page 471-478. IEEE Computer Society, (2005)