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Why current secure scan designs fail and how to fix them?, , , и . Integr., (2017)A New Multiple-Round Dimension-Order Routing for Networks-on-Chip., , , и . IEICE Trans. Inf. Syst., 94-D (4): 809-821 (2011)Embedded Test Decompressor to Reduce the Required Channels and Vector Memory of Tester for Complex Processor Circuit., , , , и . IEEE Trans. Very Large Scale Integr. Syst., 15 (5): 531-540 (2007)Resilience-Aware Frequency Tuning for Neural-Network-Based Approximate Computing Chips., , , , и . IEEE Trans. Very Large Scale Integr. Syst., 25 (10): 2736-2748 (2017)A Fast Precision Tuning Solution for Always-On DNN Accelerators., , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (5): 1236-1248 (2022)Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug., , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 38 (4): 767-779 (2019)Abstraction-Guided Simulation Using Markov Analysis for Functional Verification., , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (2): 285-297 (2016)HyCA: A Hybrid Computing Architecture for Fault-Tolerant Deep Learning., , , , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (10): 3400-3413 (2022)Statistical Modeling of Soft Error Influence on Neural Networks., , , , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (11): 4152-4163 (ноября 2023)GPGPU-Based ATPG System: Myth or Reality?, , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 39 (1): 239-247 (2020)