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Pseudorandom-Pattern Test Resistance in High-Performance DSP Datapaths., and . DAC, page 813-818. ACM Press, (1996)Application specific non-volatile primary memory for embedded systems., and . CODES+ISSS, page 31-36. ACM, (2008)High durability in NAND flash memory through effective page reuse mechanisms., and . CODES+ISSS, page 205-212. ACM, (2010)Energy-effcient physically tagged caches for embedded processors with virtual memory., , and . DAC, page 17-22. ACM, (2005)A DFT approach for diagnosis and process variation-aware structural test of thermometer coded current steering DACs., and . DAC, page 851-856. ACM, (2005)Performance and energy efficient cache migrationapproach for thermal management in embedded systems., and . ACM Great Lakes Symposium on VLSI, page 365-368. ACM, (2010)Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme., and . DATE, page 63-68. IEEE Computer Society, (2010)Architectures for Silicon Nanoelectronics and Beyond., , , , , , , and . Computer, 40 (1): 25-33 (2007)Tag compression for low power in dynamically customizable embedded processors., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 23 (7): 1031-1047 (2004)Aggressive Test Cost Reductions Through Continuous Test Effectiveness Assessment., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (12): 2093-2103 (2016)