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Disambiguation of "Nakayama, Noriaki"

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Non-parametric statistical static timing analysis: an SSTA framework for arbitrary distribution.

, , , and . DAC, page 698-701. ACM, (2008)

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Kanzo Nakayama

Yoshihiro Nakayama

Nobushige Nakayama

Norio Nakayama

Kanzo Nakayama

 

Other publications of authors with the same name

Numerical simulation of neuronal population coding: influences of noise and tuning width on the coding error., and . Biol. Cybern., 73 (5): 447-456 (1995)Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress., , , , , and . IEICE Trans. Electron., 91-C (7): 1142-1150 (2008)Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability., , , , , , , , and . CICC, page 357-360. IEEE, (2001)Accurate Array-Based Measurement for Subthreshold-Current of MOS Transistors., , , and . IEEE J. Solid State Circuits, 44 (11): 2977-2986 (2009)Non-parametric statistical static timing analysis: an SSTA framework for arbitrary distribution., , , and . DAC, page 698-701. ACM, (2008)Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design., , , , , , , , , and . ASP-DAC, page 179-183. ACM, (2003)An Evaluation Method of the Number of Monte Carlo STA Trials for Statistical Path Delay Analysis., , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 91-A (4): 957-964 (2008)Decomposition of drain-current variation into gain-factor and threshold voltage variations., , , and . ISCAS, page 1053-1056. IEEE, (2010)On discrete random dopant modeling in drift-diffusion simulations: physical meaning of 'atomistic' dopants., , , and . Microelectron. Reliab., 42 (2): 189-199 (2002)1/f-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation., , , , , , , , , and 1 other author(s). IEICE Trans. Electron., 88-C (2): 247-254 (2005)