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Disambiguation of "Kundu, Subhadip"

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Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set.

, , , and . ITC, page 1-7. IEEE, (2017)

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Subhadip Chakrabarti

Arijit Kundu

Shankhamala Kundu

Sudip Kundu

Sudipta Kundu

 

Other publications of authors with the same name

Using Custom Fault Models to Improve Understanding of Silicon Failures., , , and . ITC, page 348-354. IEEE, (2022)A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection., , , and . VLSI Design, page 436-441. IEEE Computer Society, (2012)Efficient Don't Care Filling for Power Reduction during Testing., and . ARTCom, page 319-323. IEEE Computer Society, (2009)Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption., , and . Asian Test Symposium, page 307-312. IEEE Computer Society, (2009)Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (3): 696-700 (2014)Revisiting Test Compression Configuration in Context of Multi-Core Testing Using Packetized Scan Network., and . VLSID, page 724-729. IEEE, (2024)Customizing pattern set for test power reduction via improved X-identification and reordering., , , and . ISLPED, page 177-182. ACM, (2010)Particle Swarm Optimization Based BIST Design for Memory Cores in Mesh Based Network-on-Chip., , , and . VDAT, volume 7373 of Lecture Notes in Computer Science, page 343-349. Springer, (2012)A Metric for Test Set Characterization and Customization Toward Fault Diagnosis., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 32 (11): 1824-1828 (2013)A Novel Technique to Reduce both Leakage and Peak Power during Scan Testing., , and . ICIIS, page 1-6. IEEE, (2008)