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Investigation on Realistic Stuck-on/off Defects to Complement IEEE P2427 Draft Standard.

, , , , , and . ISQED, page 51-57. IEEE, (2022)

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A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies., , , , , and . Microelectron. Reliab., 41 (12): 1939-1945 (2001)An Extended Analytic Model for the Heating of Bondwires., , , and . CoRR, (2017)Investigation on Realistic Stuck-on/off Defects to Complement IEEE P2427 Draft Standard., , , , , and . ISQED, page 51-57. IEEE, (2022)Design and Characterization of Bias Tee Used for S-parameter Characterization of Power Inductors., , , and . MIPRO, page 82-86. IEEE, (2019)Multi-domain simulation as a foundation for the engineering of smart systems: Challenges and the SMAC vision., , , , and . ICECS, page 858-861. IEEE, (2014)DC/DC converter dead-time variation analysis and far-field radiation estimation., , , and . EMC Compo, page 7-12. IEEE, (2015)Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 43 (1): 16-29 (January 2024)SPICE analysis of RL and RC snubber circuits for synchronous buck DC-DC converters., , , and . MIPRO, page 91-97. IEEE, (2015)Next Generation Smart Power Technologies - Challenges and Innovations Enabling Complex SoC Integration., , , , , and . ISSCC, page 296-297. IEEE, (2008)A New Charge based Compact Model for Lateral Asymmetric MOSFET and its application to High Voltage MOSFET Modeling., , , , , and . VLSI Design, page 177-182. IEEE Computer Society, (2007)