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Disambiguation of "Hawkins, Charles F."

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CMOS IC reliability indicators and burn-in economics.

, , , and . ITC, page 194-203. IEEE Computer Society, (1998)

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Byron Hawkins

Daniel Hawkins

Beth Hawkins

Mildred Hawkins

Heidi-Jayne Hawkins

 

Other publications of authors with the same name

IDDQ Testing: Issues Present and Future., and . IEEE Des. Test Comput., 13 (4): 61-65 (1996)Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ., , , , , and . ITC, page 1051-1059. IEEE Computer Society, (2000)Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets., , , and . ITC, page 427-435. IEEE Computer Society, (1990)Zero defects or zero stuck-at faults-CMOS IC process improvement with IDDQ., , and . ITC, page 255-256. IEEE Computer Society, (1990)Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths., , , , and . IEEE Des. Test, 30 (6): 70-79 (2013)Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments., , , , , and . VTS, page 286-291. IEEE Computer Society, (2001)Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs., and . ITC, page 443-451. IEEE Computer Society, (1986)Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ., , , and . IEEE Trans. Very Large Scale Integr. Syst., 11 (5): 863-870 (2003)IDDQ testing: A review., , , and . J. Electron. Test., 3 (4): 291-303 (1992)IDDQ Design and Test Advantages Propel Industry., and . IEEE Des. Test Comput., 12 (2): 40-41 (1995)