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A new method for in situ measurement of parameters and degradation processes in modern nanoscale programmable devices.

, and . Microprocess. Microsystems, 38 (6): 605-619 (2014)

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Fault detection and self repair in Hsiao-code FEC circuits., , and . DDECS, page 42-47. IEEE, (2017)On measurement of impact of the metallization and FPGA design to the changes of slice parameters and generation of delay faults., and . FPL, page 743-746. IEEE, (2012)Optimal Dependability and Fine Granular Error Resilience Methodology for Reconfigurable Systems., , and . DSD, page 206-213. IEEE Computer Society, (2018)A new method for in situ measurement of parameters and degradation processes in modern nanoscale programmable devices., and . Microprocess. Microsystems, 38 (6): 605-619 (2014)AmBRAMs - An analysis tool, method and framework for advanced measurements and reliability assessments on modern nanoscale FPGAs.. FPL, page 1. IEEE, (2015)Multifunctional Programmable Single-Board CAN Monitoring Module.. FPL, volume 1896 of Lecture Notes in Computer Science, page 163-168. Springer, (2000)Iterative error correction with double/triple error detection., and . SPA, page 14-19. IEEE, (2016)On measurement of parameters of programmable microelectronic nanostructures under accelerating extreme conditions (Xilinx 28nm XC7Z020 Zynq FPGA)., and . FPL, page 1-4. IEEE, (2013)On comparison of robust configurable FPGA encoders for dependable industrial communication systems., , and . IOLTS, page 199-200. IEEE, (2017)The coarse and fine granular fault tolerance techniques in FPGA-based processors., , and . SPA, page 116-120. IEEE, (2017)