Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

CMOS scaling into the 21st century: 0.1 µm and beyond.

Y. Taur, Y. Mii, D. Frank, H. Wong, D. Buchanan, S. Wind, S. Rishton, W. Sai-Halasz, and E. Nowak. IBM J. Res. Dev., 39 (1-2): 245-260 (1995)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Irina Taurit

Daniel Taurat

Bernhard Taurat

Lena Taureck

Pia Christin Taureck

Other publications of authors with the same name

Determination of energy and spatial distribution of oxide border traps in In0.53Ga0.47As MOS capacitors from capacitance-voltage characteristics measured at various temperatures.C. Dou, D. Lin, A. Vais, T. Ivanov, H. Chen, K. Martens, K. Kakushima, H. Iwai, Y. Taur, A. Thean and 1 other author(s). Microelectron. Reliab., 54 (4): 746-754 (2014)CMOS scaling into the 21st century: 0.1 µm and beyond.Y. Taur, Y. Mii, D. Frank, H. Wong, D. Buchanan, S. Wind, S. Rishton, W. Sai-Halasz, and E. Nowak. IBM J. Res. Dev., 39 (1-2): 245-260 (1995)A Review on Compact Modeling of Multiple-Gate MOSFETs.J. Song, B. Yu, Y. Yuan, and Y. Taur. IEEE Trans. Circuits Syst. I Regul. Pap., 56-I (8): 1858-1869 (2009)Compact modeling of multiple-gate MOSFETs.Y. Taur, J. Song, and B. Yu. CICC, page 257-264. IEEE, (2008)A half-micron CMOS logic generation.C. III, W. Clark, J. Adkisson, E. Adler, P. Bakeman, A. Bergendahl, A. Botula, W. Chang, B. Davari, J. Givens and 14 other author(s). IBM J. Res. Dev., 39 (1-2): 215-228 (1995)Device scaling limits of Si MOSFETs and their application dependencies.D. Frank, R. Dennard, E. Nowak, P. Solomon, Y. Taur, and H. Wong. Proc. IEEE, 89 (3): 259-288 (2001)Modeling and characterization of quantization, polysilicon depletion, and direct tunneling effects in MOSFETs with ultrathin oxides.S. Lo, D. Buchanan, and Y. Taur. IBM J. Res. Dev., 43 (3): 327-338 (1999)CMOS scaling into the nanometer regime.Y. Taur, D. Buchanan, W. Chen, D. Frank, K. Ismail, S. Lo, G. Sai-Halasz, R. Viswanathan, H. Wann, S. Wind and 1 other author(s). Proc. IEEE, 85 (4): 486-504 (1997)4- and 13-GHz tuned amplifiers implemented in a 0.1-μm CMOS technology on SOI, SOS, and bulk substrates.Y. Ho, K. Kim, B. Floyd, C. Wann, Y. Taur, I. Lagnado, and K. O. IEEE J. Solid State Circuits, 33 (12): 2066-2073 (1998)Transistors and IC design.Y. Taur. Advances in Computers, (2001)

BibSonomy

Disambiguation of "Taur, Yuan"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

CMOS scaling into the 21st century: 0.1 µm and beyond.

Please choose a person to relate this publication to

Irina Taurit

Daniel Taurat

Bernhard Taurat

Lena Taureck

Pia Christin Taureck

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Taur, Yuan"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML CMOS scaling into the 21st century: 0.1 µm and beyond.

Please choose a person to relate this publication to

Irina Taurit

Daniel Taurat

Bernhard Taurat

Lena Taureck

Pia Christin Taureck

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

CMOS scaling into the 21st century: 0.1 µm and beyond.