F. Lombardi. Proceedings of the Records of the 2004 International Workshop on Memory Technology, Design and Testing, Seite 38--43. Washington, DC, USA, IEEE Computer Society, (2004)
L. Schiano, M. Ottavi, und F. Lombardi. Memory Technology, Design and Testing, 2004. Records of the 2004 International Workshop on, Seite 38-43. (August 2004)
T. Dohi, K. Iwamoto, H. Okamura, und N. Kaio. High Assurance Systems Engineering, 2002. Proceedings. 7th IEEE International Symposium on, Seite 159-166. (2002)