@article{journals/jssc/TakedaSAAHITNTH11,
added-at = {2020-10-26T00:00:00.000+0100},
author = {Takeda, Koichi and Saito, Toshio and Asayama, Shinobu and Aimoto, Yoshiharu and Kobatake, Hiroyuki and Ito, Shinya and Takahashi, Toshifumi and Nomura, Masahiro and Takeuchi, Kiyoshi and Hayashi, Yoshihiro},
biburl = {https://www.bibsonomy.org/bibtex/247d0e4daecb6f7dc4c2dc282868a9be8/dblp},
ee = {https://doi.org/10.1109/JSSC.2011.2109434},
interhash = {0dbe7573162e317bd271d4c1777cacc8},
intrahash = {47d0e4daecb6f7dc4c2dc282868a9be8},
journal = {IEEE J. Solid State Circuits},
keywords = {dblp},
number = 4,
pages = {806-814},
timestamp = {2020-10-27T11:40:02.000+0100},
title = {Multi-Step Word-Line Control Technology in Hierarchical Cell Architecture for Scaled-Down High-Density SRAMs.},
url = {http://dblp.uni-trier.de/db/journals/jssc/jssc46.html#TakedaSAAHITNTH11},
volume = 46,
year = 2011
}