%0 Journal Article %1 journals/et/KunduZSG01 %A Kundu, Sandip %A Zachariah, Sujit T. %A Sengupta, Sanjay %A Galivanche, Rajesh %D 2001 %J J. Electron. Test. %K dblp %N 3-4 %P 209-218 %T Test Challenges in Nanometer Technologies. %U http://dblp.uni-trier.de/db/journals/et/et17.html#KunduZSG01 %V 17

@article{journals/et/KunduZSG01, added-at = {2020-09-11T00:00:00.000+0200}, author = {Kundu, Sandip and Zachariah, Sujit T. and Sengupta, Sanjay and Galivanche, Rajesh}, biburl = {https://www.bibsonomy.org/bibtex/270ef44e46fa28ca1f1e5e1f1ae664a6f/dblp}, ee = {https://doi.org/10.1023/A:1012203009875}, interhash = {26c8bc1ed361daf2bcee631216f2aeea}, intrahash = {70ef44e46fa28ca1f1e5e1f1ae664a6f}, journal = {J. Electron. Test.}, keywords = {dblp}, number = {3-4}, pages = {209-218}, timestamp = {2020-09-12T11:40:48.000+0200}, title = {Test Challenges in Nanometer Technologies.}, url = {http://dblp.uni-trier.de/db/journals/et/et17.html#KunduZSG01}, volume = 17, year = 2001 }