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A Novel Algorithm for Multi-Node Bridge Analysis of Large VLSI Circuits., and . VLSI Design, page 333-338. IEEE Computer Society, (2001)Logic proximity bridges., , , and . ITC, page 10. IEEE Computer Society, (2005)Experimental Evaluation of Scan Tests for Bridges., , , , and . ITC, page 509-518. IEEE Computer Society, (2002)Extraction of two-node bridges from large industrial circuits., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 23 (3): 433-439 (2004)STBM: a fast algorithm to simulate IDDQ tests forleakage faults., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 19 (5): 568-576 (2000)A scalable and efficient methodology to extract two node bridges from large industrial circuits., and . ITC, page 750-759. IEEE Computer Society, (2000)Layout Analysis to Extract Open Nets Caused by Systematic Failure Mechanisms., , , , , and . VTS, page 367-372. IEEE Computer Society, (2002)On modeling crosstalk faults., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 24 (12): 1909-1915 (2005)Algorithm to extract two-node bridges., and . IEEE Trans. Very Large Scale Integr. Syst., 11 (4): 741-744 (2003)On Modeling Cross-Talk Faults., , , and . DATE, page 10490-10495. IEEE Computer Society, (2003)