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Global Signal Vulnerability (GSV) Analysis for Selective State Element Hardening in Modern Microprocessors., , , and . IEEE Trans. Computers, 61 (10): 1361-1370 (2012)Test Roles in Diagnosis and Silicon Debug., , , , , , and . ATS, page 367. IEEE, (2007)A low-cost concurrent error detection technique for processor control logic., , , , and . DATE, page 897-902. ACM, (2008)Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 25 (1): 238-246 (2017)Low Cost Concurrent Error Detection Strategy for the Control Logic of High Performance Microprocessors and Its Application to the Instruction Decoder., , , , , and . J. Electron. Test., 29 (3): 401-413 (2013)Session Abstract., and . VTS, page 422-423. IEEE Computer Society, (2006)Guest Editors' Introduction: Special Section on Concurrent On-Line Testing and Error/Fault Resilience of Digital Systems., and . IEEE Trans. Computers, 60 (9): 1217-1218 (2011)Testing in the year 2020., , and . DATE, page 960-965. EDA Consortium, San Jose, CA, USA, (2007)Path coverage based functional test generation for processor marginality validation., , , and . ITC, page 544-552. IEEE Computer Society, (2010)Function-Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic., , , , and . ETS, page 171-176. IEEE Computer Society, (2008)