%0 Conference Paper %1 conf/itc/ZordanBDGTVB13 %A Zordan, Leonardo Bonet %A Bosio, Alberto %A Dilillo, Luigi %A Girard, Patrick %A Todri, Aida %A Virazel, Arnaud %A Badereddine, Nabil %B ITC %D 2013 %I IEEE Computer Society %K dblp %P 1-10 %T On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs. %U http://dblp.uni-trier.de/db/conf/itc/itc2013.html#ZordanBDGTVB13 %@ 978-1-4799-0859-2

@inproceedings{conf/itc/ZordanBDGTVB13, added-at = {2023-03-23T00:00:00.000+0100}, author = {Zordan, Leonardo Bonet and Bosio, Alberto and Dilillo, Luigi and Girard, Patrick and Todri, Aida and Virazel, Arnaud and Badereddine, Nabil}, biburl = {https://www.bibsonomy.org/bibtex/2fb5838a6505a8ec7a6614b0c92e80363/dblp}, booktitle = {ITC}, crossref = {conf/itc/2013}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2013.6651927}, interhash = {855631d6c758b42257c55e21f9e8a8c3}, intrahash = {fb5838a6505a8ec7a6614b0c92e80363}, isbn = {978-1-4799-0859-2}, keywords = {dblp}, pages = {1-10}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:29:44.000+0200}, title = {On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2013.html#ZordanBDGTVB13}, year = 2013 }