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%0 Journal Article
%1 journals/tvlsi/KeshavarziRHD03
%A Keshavarzi, Ali
%A Roy, Kaushik
%A Hawkins, Charles F.
%A De, Vivek
%D 2003
%J IEEE Trans. Very Large Scale Integr. Syst.
%K dblp
%N 5
%P 863-870
%T Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ.
%U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi11.html#KeshavarziRHD03
%V 11
@article{journals/tvlsi/KeshavarziRHD03,
added-at = {2020-03-11T00:00:00.000+0100},
author = {Keshavarzi, Ali and Roy, Kaushik and Hawkins, Charles F. and De, Vivek},
biburl = {https://www.bibsonomy.org/bibtex/23b47d519111b21c0e5216057b042076e/dblp},
ee = {https://doi.org/10.1109/TVLSI.2003.812298},
interhash = {b0ea98f4dab5760b4b1d1dfea343daef},
intrahash = {3b47d519111b21c0e5216057b042076e},
journal = {IEEE Trans. Very Large Scale Integr. Syst.},
keywords = {dblp},
number = 5,
pages = {863-870},
timestamp = {2020-03-12T11:44:49.000+0100},
title = {Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ.},
url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi11.html#KeshavarziRHD03},
volume = 11,
year = 2003
}
