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%0 Conference Paper
%1 conf/itc-asia/MarinissenFWKHS17
%A Marinissen, Erik Jan
%A Fodor, Ferenc
%A Wachter, Bart De
%A Kiesewetter, Jorg
%A Hill, Eric
%A Smith, Ken
%B ITC-Asia
%D 2017
%I IEEE
%K dblp
%P 144-149
%T A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards.
%U http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2017.html#MarinissenFWKHS17
%@ 978-1-5386-3051-8
@inproceedings{conf/itc-asia/MarinissenFWKHS17,
added-at = {2024-02-05T00:00:00.000+0100},
author = {Marinissen, Erik Jan and Fodor, Ferenc and Wachter, Bart De and Kiesewetter, Jorg and Hill, Eric and Smith, Ken},
biburl = {https://www.bibsonomy.org/bibtex/28482c799139f8771f820db01599029e8/dblp},
booktitle = {ITC-Asia},
crossref = {conf/itc-asia/2017},
ee = {https://doi.org/10.1109/ITC-ASIA.2017.8097130},
interhash = {d19e4c722c2ed1f38acbca6ba052adf4},
intrahash = {8482c799139f8771f820db01599029e8},
isbn = {978-1-5386-3051-8},
keywords = {dblp},
pages = {144-149},
publisher = {IEEE},
timestamp = {2024-04-09T21:38:03.000+0200},
title = {A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards.},
url = {http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2017.html#MarinissenFWKHS17},
year = 2017
}
