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A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards.

E. Marinissen, F. Fodor, B. Wachter, J. Kiesewetter, E. Hill, and K. Smith. ITC-Asia, page 144-149. IEEE, (2017)

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Bart Cramer

Bart Maris

Bart Kersbergen

Bart Riel

Bart Geurts

Other publications of authors with the same name

Design Issues and Considerations for Low-Cost 3-D TSV IC Technology.G. der Plas, P. Limaye, I. Loi, A. Mercha, H. Oprins, C. Torregiani, S. Thijs, D. Linten, M. Stucchi, G. Katti and 27 other author(s). IEEE J. Solid State Circuits, 46 (1): 293-307 (2011)3D chip package interaction thermo-mechanical challenges: Proximity effects of Through Silicon vias and μ-bumps.W. Guo, G. der Plas, A. Ivankovic, G. Eneman, V. Cherman, B. Wachter, A. Mercha, M. Gonzalez, Y. Civale, A. Redolfi and 9 other author(s). ICICDT, page 1-4. IEEE, (2012)A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards.E. Marinissen, F. Fodor, B. Wachter, J. Kiesewetter, E. Hill, and K. Smith. ITC-Asia, page 144-149. IEEE, (2017)Circuit Design for Bias Compatibility in Novel FinFET-Based Floating-Body RAM.P. Poliakov, A. Anchlia, M. Bardon, B. Rooseleer, B. Wachter, N. Collaert, K. van der Zanden, W. Dehaene, D. Verkest, and M. Miranda. IEEE Trans. Circuits Syst. II Express Briefs, 57-II (3): 183-187 (2010)Vesuvius-3D: A 3D-DfT demonstrator.E. Marinissen, B. Wachter, S. O'Loughlin, S. Deutsch, C. Papameletis, and T. Burgherr. ITC, page 1-10. IEEE Computer Society, (2014)Automated testing of bare die-to-die stacks.E. Marinissen, B. Wachter, T. Wang, J. Fiedler, J. Kiesewetter, and K. Stoll. ITC, page 1-10. IEEE, (2015)Design issues and considerations for low-cost 3D TSV IC technology.G. der Plas, P. Limaye, A. Mercha, H. Oprins, C. Torregiani, S. Thijs, D. Linten, M. Stucchi, G. Katti, D. Velenis and 24 other author(s). ISSCC, page 148-149. IEEE, (2010)

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Disambiguation of "Wachter, Bart De"

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A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards.

Please choose a person to relate this publication to

Bart Cramer

Bart Maris

Bart Kersbergen

Bart Riel

Bart Geurts

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wachter, Bart De"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards.

Please choose a person to relate this publication to

Bart Cramer

Bart Maris

Bart Kersbergen

Bart Riel

Bart Geurts

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards.