( en | de | ru )

 

Disambiguation of "Wen, Xiaoqing"

Author of the publication

copydeleteadd this publication to your clipboard
A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing.

, , , , , and . ITC, page 1-10. IEEE Computer Society, (2006)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

 

Other publications of authors with the same name

Power-aware test generation with guaranteed launch safety for at-speed scan testing., , , , , , , and . VTS, page 166-171. IEEE Computer Society, (2011)Single-Event Double-Upset Self-Recoverable and Single-Event Transient Pulse Filterable Latch Design for Low Power Applications., , , and . DATE, page 1679-1684. IEEE, (2019)Power supply noise and its reduction in at-speed scan testing.. ASICON, page 1-4. IEEE, (2015)Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains., , , , , , , and . ACM Trans. Design Autom. Electr. Syst., 17 (4): 48:1-48:16 (2012)Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing., , , , , and . DAC, page 527-532. IEEE, (2007)Novel Quadruple Cross-Coupled Memory Cell Designs With Protection Against Single Event Upsets and Double-Node Upsets., , , , , , and . IEEE Access, (2019)Efficient Guided-Probe Fault Location Method for Sequential Circuits., , , and . IEICE Trans. Inf. Syst., 78-D (2): 122-129 (1995)Efficient Test Set Modification for Capture Power Reduction., , , , , , and . J. Low Power Electron., 1 (3): 319-330 (2005)Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of Transition Delay Fault Patterns., , , , , and . J. Low Power Electron., 8 (2): 248-258 (2012)A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application., , , , , , , and . IEEE Trans. Circuits Syst. II Express Briefs, 66-II (2): 287-291 (2019)