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Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ., , , , , , , , , и . DELTA, стр. 135-139. IEEE Computer Society, (2004)Test Engineering Education in Europe: the EuNICE-Test Project., , , , , , , , , и 1 other автор(ы). MSE, стр. 85-86. IEEE Computer Society, (2003)Efficient Production Binning Using Octree Tessellation in the Alternate Measurements Space., , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (8): 1386-1395 (2016)Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours., , , и . J. Electron. Test., 20 (2): 143-153 (2004)Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours., , , и . IOLTW, стр. 99-103. IEEE Computer Society, (2002)BIST Technique by Equally Spaced Test Vector Sequences., , , , , , и . VTS, стр. 206-216. IEEE Computer Society, (2004)On the selection of efficient arithmetic additive test pattern generators logic test., , , , , , и . ETW, стр. 9-14. IEEE Computer Society, (2003)Indirect test of M-S circuits using multiple specification band guarding., , и . Integr., (2016)M-S specification binning based on digitally coded indirect measurements., , и . ETS, стр. 1-6. IEEE, (2014)On High-Quality, Low Energy BIST Preparation at RT-Level., , , , , и . LATW, стр. 52-57. IEEE, (2002)