( en | de | ru )

 

Disambiguation of "Lu, Shyue-Kung"

Author of the publication

copydeleteadd this publication to your clipboard
A Testable/Fault Tolerant FFT Processor Design.

, , and . Asian Test Symposium, page 429-. IEEE Computer Society, (2000)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Lu Lu

Zigmas Kungys

Hans Kungl

Angela Brigitte Kung

Sebastian Küng

 

Other publications of authors with the same name

Fault-Aware Dependability Enhancement Techniques for Flash Memories., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 28 (3): 634-645 (2020)Efficient test and repair architectures for 3D TSV-based random access memories., , , and . VLSI-DAT, page 1-4. IEEE, (2013)Hybrid scrambling technique for increasing the fabrication yield of NROM-Based ROMs., , , and . VLSI-DAT, page 1-4. IEEE, (2015)Enhanced Interconnect Test Method for Resistive Open Defects in Final Tests with Relaxation Oscillators., , , , , and . ATS, page 49-53. IEEE, (2022)A built-in supply current test circuit for electrical interconnect tests of 3D ICs., , , and . 3DIC, page 1-6. IEEE, (2014)Integrated Progressive Built-In Self-Repair (IPBISR) Techniques for NAND Flash Memory., and . ITC-Asia, page 1-6. IEEE, (2023)A defect level monitor of resistive open defect at interconnects in 3D ICs by injected charge volume., , , , and . ISCIT, page 1-5. IEEE, (2017)Combinational circuit fault diagnosis using logic emulation., , , , and . ISCAS (5), page 549-552. IEEE, (2003)Scrambling and Data Inversion Techniques for Yield Enhancement of NROM-Based ROMs., , and . Asian Test Symposium, page 308-313. IEEE Computer Society, (2012)A Multi-Faceted Approach towards Spam-Resistible Mail., , , , and . PRDC, page 208-218. IEEE Computer Society, (2005)