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A Metastability Risk Prediction and Mitigation Technique for Clock-Domain Crossing With Single-Stage Synchronizer in Near-Threshold-Voltage Multivoltage/ Frequency-Domain Network-on-Chip.

C. Lin, W. He, Y. Sun, L. Shao, B. Zhang, J. Yang, and M. Seok. IEEE J. Solid State Circuits, 59 (2): 616-625 (February 2024)

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Lin Lin

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MEDAC: A Metastability Condition Detection and Correction Technique for a Near-Threshold-Voltage Multi-Voltage-/Frequency-Domain Network-on-Chip.C. Lin, W. He, Y. Sun, B. Pei, P. Chundi, Z. Mao, and M. Seok. IEEE J. Solid State Circuits, 56 (7): 2270-2280 (2021)A Metastability Risk Prediction and Mitigation Technique for Clock-Domain Crossing With Single-Stage Synchronizer in Near-Threshold-Voltage Multivoltage/ Frequency-Domain Network-on-Chip.C. Lin, W. He, Y. Sun, L. Shao, B. Zhang, J. Yang, and M. Seok. IEEE J. Solid State Circuits, 59 (2): 616-625 (February 2024)CDAR-DRAM: Enabling Runtime DRAM Performance and Energy Optimization via In-Situ Charge Detection and Adaptive Data Restoration.Y. Qin, C. Lin, W. He, Y. Sun, Z. Mao, and M. Seok. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (9): 3078-3091 (September 2023)CDAR-DRAM: An In-situ Charge Detection and Adaptive Data Restoration DRAM Architecture for Performance and Energy Efficiency Improvement.C. Lin, W. He, Y. Sun, Z. Mao, and M. Seok. DAC, page 1093-1098. IEEE, (2021)MPAM: Reliable, Low-Latency, Near-Threshold-Voltage Multi-Voltage/Frequency-Domain Network-on-Chip with Metastability Risk Prediction and Mitigation.C. Lin, W. He, Y. Sun, L. Shao, B. Zhang, J. Yang, and M. Seok. CICC, page 1-2. IEEE, (2022)A Metastability Inference and Avoidance Technique for Near-Threshold-Voltage Network-on-Chip.L. Shao, M. Lai, S. Xu, C. Lin, and W. He. ISCAS, page 1-5. IEEE, (2023)25.8 A Near- Threshold-Voltage Network-on-Chip with a Metastability Error Detection and Correction Technique for Supporting a Quad-Voltage/Frequency-Domain Ultra-Low-Power System-on-a-Chip.C. Lin, W. He, Y. Sun, B. Pei, Z. Mao, and M. Seok. ISSCC, page 394-396. IEEE, (2020)

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