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Disambiguation of "Yu, Chong-Gun"

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Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs.

, , , and . Microelectron. Reliab., 54 (9-10): 2325-2328 (2014)

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Chong Yon Yu

Vanessa Chong

Igor' Gun

Gun Akkor

Sung-Won Chong-Schachel

 

Other publications of authors with the same name

A comparative study on device degradation under a positive gate stress and hot carrier stress in InGaZnO thin film transistors., , , and . Microelectron. Reliab., 53 (9-11): 1814-1817 (2013)Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs., , , , , and . Microelectron. Reliab., 47 (9-11): 1411-1415 (2007)Drain breakdown voltage: A comparison between junctionless and inversion mode p-channel MOSFETs., , , , and . Microelectron. Reliab., 52 (9-10): 1945-1948 (2012)Increased hot carrier effects in Gate-All-Around SOI nMOSFET's., , , , and . Microelectron. Reliab., 43 (9-11): 1427-1432 (2003)An automatic offset compensation scheme with ping-pong control for CMOS operational amplifiers., and . IEEE J. Solid State Circuits, 29 (5): 601-610 (May 1994)Effects of device layout on the drain breakdown voltages in MuGFETs., , and . Microelectron. Reliab., 51 (9-11): 1547-1550 (2011)Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs., , , and . Microelectron. Reliab., 55 (9-10): 1456-1459 (2015)NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer., , , , , and . Microelectron. Reliab., 49 (9-11): 994-997 (2009)Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs., , , and . Microelectron. Reliab., 54 (9-10): 2325-2328 (2014)Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory., , and . Microelectron. Reliab., (2016)